1966/JN - Scanning Electron Microscope

The University of Sheffield requires a new desktop scanning electron microscope (SEM) to support its research in semiconductor devices. It will be used for detailed inspection and measurement of micro and nano scale structures fabricated on InP and GaAs substrates incorporating metallic and glass thin films, at various stages during the fabrication process, often with high throughput required.

The full specification and ITT can be downloaded by registering and expressing your interest on the University`s e-tendering system https://in-tendhost.co.uk/Sheffield

If you have any questions or comments in relation to this tender they must be submitted via the In-tend System, this can be accessed at https://in-tendhost.co.uk/Sheffield

Completed tenders must be returned through the in-tend e-tendering system.

The closing date for receipt of tenders is Friday 22nd June 2018 at 12 noon (UK time).