Nanoindenter for a Scanning Electron Microscope

The equipment we are looking for should enable the mechanical testing of materials within a scanning electron microscope (SEM) via insertion of a vacuum compatible mechanical testing holder/stage.

The mechanical testing device should have mechanisms for enabling both Nanoindentation and Scratch testing methodologies, under specified loading conditions, together with in-situ measurement of applied load and position. The mechanical testing device should be transferable between the air and microscope column, be compatible with the high vacuum of the SEM, and fit within specified microscope geometries.

Additional information: The tender documents can be obtained via the In-tend site following the link above. Furthermore, all correspondences relating to this opportunity & any tender returns must also be made through this site