Tender notice
Atomic Force Microscope for 2DM studies in the inert environments.
Notice details
- Published
- Category
- goods
- Buyer region
- North West
- Source
- View official notice
Public buyer
Public buyer
The University Of ManchesterTender valueNot disclosed
- Planned startAs published in the notice
- Planned endAs published in the notice
Work description
It is the intention of the University of Manchester to appoint a contractor/s for an AFM for 2DM studies in the inert environments. The project aims to study a broad range of air-sensitive 2D materials and their heterostructures, and perform scanning probe studies of their mechanical, electronic and chemical properties tested simultaneously using a state-of-the-art scanning probe instrument. The proposed platform must include a variety of Atomic Force Microscopy (AFM) modes (cAFM, EFM, PFM, Force Curves, KpFM, friction AFM, Youngs modulus measurements, non-invasive topography, nanomanipulation and nanolithography) and allow their use in an inert gas environment, such as argon or nitrogen with <1ppm of H2O and O2.
The system must be fully compatible with an argon-filled glovebox of internal workspace dimensions: 1250 mm (W) x 780 mm (D) x 900 mm (H) and fitted with anti-vibration optical table to support the AFM system. In avoidance of doubt, the system must perform as specified in the Minimum Outcome Specifications when operated under an inert argon or nitrogen filled atmosphere with <1 ppm H2O and <1 ppm O2.
Additional information: To express an interest in this project please visit the website below where you will need to register to obtain tender documentation.
https://in-tendhost.co.uk/universityofmanchester/aspx/Home
Delivery Notes
The University of Manchester seeks bids from a contractor/s for an AFM for 2DM studies in the inert environments. The project aims to study a broad range of air-sensitive 2D materials and their heterostructures, and perform scanning probe studies of their mechanical, electronic and chemical properties tested simultaneously using a state-of-the-art scanning probe instrument. The proposed platform must include a variety of Atomic Force Microscopy (AFM) modes (cAFM, EFM, PFM, Force Curves, KpFM, friction AFM, Youngs modulus measurements, non-invasive topography, nanomanipulation and nanolithography) and allow their use in an inert gas environment, such as argon or nitrogen with <1ppm of H2O and O2.
The system must be fully compatible with an argon-filled glovebox of internal workspace dimensions: 1250 mm (W) x 780 mm (D) x 900 mm (H) and fitted with anti-vibration optical table to support the AFM system. In avoidance of doubt, the system must perform as specified in the Minimum Outcome Specifications when operated under an inert argon or nitrogen filled atmosphere with <1 ppm H2O and <1 ppm O2.
Is a Recurrent Procurement Type? : No